Symbol | Parameter | Limited Value | Units | |
---|---|---|---|---|
ID | Continuous drain current @TC=25°C | 23 | A | |
Continuous drain current @TC=100°C | 15 | A | ||
IDM | Pulsed drain current @TC=25°C (pulse width: 10us) | 82 | A | |
Pulsed drain current @TC=150°C (pulse width: 10us) | 62 | A | ||
VDSS | Drain to source voltage (TJ = -55°C to 150°C) | 650 | V | |
VGSS | Gate to source voltage | ±20 | V | |
PD | Maximum power dissipation @TC=25°C | 100 | W | |
TC | Operating temperature | Case | -55 to 150 | °C |
TJ | Junction | -55 to 150 | °C | |
TS | Storage temperature | -55 to 150 | °C | |
TCSOLD | Soldering peak temperature | 260 | °C |
Symbol | Parameter | Typical | Units |
---|---|---|---|
RθJC | Junction-to-Case | 1.25 | °C/W |
RθJA | Junction-to-Ambient | 50 | °C/W |
Symbol | Min | Typ | Max | Unit | Test Conditions |
---|---|---|---|---|---|
Forward Device Characteristics | |||||
VDSS -MAX | 650 | - | - | V | VGS=0V |
BVDSS | - | 1700 | - | V | VGS=0V, IDSS=250μA |
VGS(th) | - | 1.82 | - | V | VDS=VGS, ID=500μA |
RDS(on)1 | - | 125 | 150 | mΩ | VGS=8V, ID=4A, TJ=25°C |
- | 250 | - | VGS=8V, ID=4A, TJ=150°C | ||
IDSS | - | 8 | 20 | μA | VDS=700V, VGS=0V, TJ =25°C |
- | 70 | - | μA | VDS=700V, VGS=0V, TJ =150°C | |
IGSS | - | - | 150 | nA | VGS=20V |
- | - | - 150 | nA | VGS=-20V | |
CISS | - | 500 | - | pF | VGS=0V, VDS=650V, f=1MHz |
COSS | - | 50 | - | pF | |
CRSS | - | 4 | - | pF | |
CO(er) | - | 60 | - | pF | VGS=0V, VDS=0 to 650V |
CO(tr) | - | 100 | - | pF | |
QG | - | 12.5 | - | nC | VDS=400V, VGS=0V to 8V, ID=10A |
QGS | - | 3.7 | - | ||
QGD | - | 2.2 | - | ||
tD(on) | - | 16 | - | nS | VDS=400V, VGS=0V to 12V, ID=10A, RG=20Ω |
tR | - | 10 | - | ||
tD(off) | - | 52 | - | ||
tF | - | 10 | - | ||
Reverse Device Characteristics | |||||
VSD | - | 1.3 | - | V | VGS=0V, IS=5A, TJ=25°C |
- | 1.9 | - | VGS=0V, IS=10A, TJ =25°C | ||
- | 3 | - | VGS=0V, IS=10A, TJ =150°C | ||
tRR | - | 12 | - | ns | IS=10A, VGS=0V, di/dt=1000A/us, VDD=400V |
QRR | - | 38 | - | nC |
Notes: 1. Dynamic on-resistance; see Fig. 18 and 19 for test circuit and conditions.